Exhibitors (as of Dec 1)

For any inquiries or requests regarding exhibitions at the conference, please contact the Organizing Committee.

UNISOKU Co.,Ltd.
Tec Corporation
OLYMPUS　CORPORATION
FUJI IMVAC, INC.
Omicron NanoTechnology Japan Inc.
JEOL Ltd.
Asylum Technology
SHIMADZU CORPORATION
Tomoe Engineering Co.,Ltd
Shoshin Em Corporation

• UNISOKU Co.,Ltd.

  Exhibition:	UHV LT Multi-Probe SPM system
  Short presentation:
  	UHV LT Multi-Probe SPM system
  Contact:	Toshiaki Nagamura < toshiaki@unisoku.co.jp>
  Address:	2-4-3, KASUGANO, HIRAKATA, OSAKA 573-0131, JAPAN
  Tel/Fax:	+81-72-858-6456 / +81-72-859-5655
  Url:	http://www.unisoku.co.jp/ http://www.unisoku.com/

  
  
• Tec Corporation

  Exhibition:	(1) SPECS Zurich: Nanonis SPM Controller, Digital Oscillation Controller (2) SPECS: SPECS JT-SPM UHV System High Speed Scan & Variable Temperature SPM Head (3) NANOSURF: Nanosurf easyPLL plus (4) FERROVAC: Precision Wobblestick Manipulator, Linear/Rotary Feedthrough, Precision Rotary Feedthrough MOTT Polarimeter Measurement System (5) CHELL: Miniature K-Cell (6) Other: SPM Quartz-Crystal Resonator, Tuning Fork Circuit Board, UHV TF PreAmp AFM Type Measurement System with Sample Large Stage
  Short presentation:
  	Introduction of the Nanonis SPM Controller and the SPECS JT-SPM UHV System
  Contact:	Keigo Matsuda < matsuda@t-e-c.co.jp>
  Address:	7-19-26-311 Oizumigakuen-cho, Nerima-ku, Tokyo 178-0061, Japan
  Tel/Fax:	+81-3-5935-1060 / +81-3-5935-1070
  Url:	http://www.kagaku.com/tec/ http://www.specs-zurich.com/ http://www.specs.de/ http://www.nanosurf.com/ http://www.ferrovac.com/

  
  
• OLYMPUS　CORPORATION

  Exhibition:	MICRO CANTILEVER
  Short presentation:
  	Introduction of new concept cantilever
  Contact:	Takaaki　Takenobu < takaaki_takenobu@ot.olympus.co.jp>
  Address:	2-3 Kuboyama-cho,Hachioji-shi,Tokyo,192-8512,Japan
  Tel/Fax:	+81-42-691-7403 / +81-42-691-7509
  Url:	http://www.olympus.co.jp/probe

  
  
• FUJI IMVAC, INC.

  Exhibition:	Pencil-type scanning probe microscope for combined instuments
  Short presentation:
  	Pencil-type scanning probe microscope for combined instuments
  Contact:	Hideki Saito < saitou@fuji-imvac.co.jp>
  Address:	6-18 Higashi-machi, Isogo, Yokohama 235-0005, Japan
  Tel/Fax:	+81-45-755-2261 / +81-45-755-2282
  Url:	http://www.fuji-imvac.co.jp/

  
  
• Omicron NanoTechnology Japan Inc.

  Exhibition:	Posters and catalogs of LT-STM/Q-Plus
  Short presentation:
  	Application by using low temperature SPM with QPlus sensor.
  Contact:	Naoko OIWA < n.oiwa@omicron.jp>
  Address:	5-30-15-403 Kamata Ota-ku Tokyo 144-0052 JAPAN
  Tel/Fax:	+81-3-6661-0850 / +81-3-6661-0855
  Url:	http//www.omicron.jp/

  
  
• JEOL Ltd.

  Exhibition:	Scanning Probe Microscope JSPM-5410
  Short presentation:
  	Introduction of JEOL SPM's
  Contact:	Dr. Keiichi Nakamoto < sales-eo@jeol.co.jp>
  Address:	Shin-suzuharu Bldg. 2-8-3 Akebono-Cho Tachikawa-Shi TOKYO 190-0012 JAPAN
  Tel/Fax:	+81-42-528-3353 / +81-42-528-3386
  Url:	http://www.jeol.co.jp/

  
  
• Asylum Technology

  Exhibition:	World Highest Resolution Cypher AFM is shown up and we will run the samples you will bring. Please contact us for sample size and preparations in advance.
  Short presentation:
  	Cypher AFM:　Ultra lower noise performance enough to visualize 'true' atoms in Tapping mode
  Contact:	Haruo Takami < takami@asylumtec.co.jp>
  Address:	102 Tsunashima No.2 Annex Bldg. 20-12,Yushima 3-chome, Bunkyo-ku, Tokyo 113-0034, Japan
  Tel/Fax:	+81-3-5812-9801 / +81-3-5812-9802
  Url:	http://www.Asylumtec.co.jp/ http://www.AsylumResearch.com/

  
  
• SHIMADZU CORPORATION

  Exhibition:	A New SPM Equipment SPM-9600 Model
  Short presentation:
  	A New SPM Equipment and Its Related Technique
  Contact:	Marketing Department Analytical & Measuring Instruments Division < surface2@group.shimadzu.co.jp>
  Address:	1, Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto 604-8511, Japan
  Tel/Fax:	+81-75-823-1468 / +81-75-823-1380
  Url:	http://www.shimadzu.co.jp/surface/products/sol/sp_index.html http://www.shimadzu.com/products/lab/surface/spmd.html

  
  
• Tomoe Engineering Co.,Ltd

  Exhibition:	Nanonics Imaging MultiProbe NSOM/SPM system SPM Cabtilevers
  Short presentation:
  	MultiProbe NSOM/SPM system and Cantilevers
  Contact:	Akifumi Kobayashi < akobayashi@tomo-e.co.jp>
  Address:	12th Floor, Art Village Osaki Central Tower, 2-2, Osaki 1-chome, Shinagawa-ku, Tokyo 141-0032
  Tel/Fax:	+81-3-5435-6515 / +81-3-5435-0071
  Url:	http://www.tomo-e.co.jp/

  
  
• Shoshin Em Corporation

  Exhibition:	Scanning Ion Conductance Microscope by ionscope
  Short presentation:
  	Scanning Ion Conductance Microscope
  Contact:	Koji Osada < info@shoshinem.com>
  Address:	1-14 Kuranishi, Akashibu-cho, Okazaki, 444-0241 Aichi, Japan
  Tel/Fax:	+81-564-54-1231 / +81-564-54-3207
  Url:	http://shoshinem.com/